（图1、4取自视频BV1Fz411z7XR，图2、3分别取自An Integrated EMI Choke With Improved DM Inductance & An Integrated EMI Choke for Differential-Mode and Common-Mode Noise Suppression）

For the purposes of testing conducted emission with standards like CISPR 16-1-2 and MIL-STD-461(Usually between 150kHz and 30MHz).

*EUT: Equipment Under Test

图1：LISN连接方式

图2：LISN在EMI测试中的连接方式1

图3：LISN在EMI测试中的连接方式2

LISN的介绍及功能：

图4：LISN的介绍及功能